Method for manufacturing a semiconductor device having a heat radiator
AssigneeSeiko Epson Corporation
InventorTetsuya Ootsuki
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AssigneeSeiko Epson Corporation
InventorTetsuya Ootsuki
Estimating the term…
A highly reliable semiconductor device and a method of manufacturing the same. The semiconductor device is constituted by a semiconductor element which is disposed within a space portion defined by leads of a lead frame or fixed to a die pad of a lead frame and which has bonding pads connected to the leads through wires respectively, and a heat radiation block/plate which is made of a good thermally conductive material and which has an outer periphery having a size sufficiently to overlap the leads so that the heat radiation block/plate is disposed on the leads partly through a tape-like insulator, the semiconductor element being disposed on a center portion of the heat radiation block/plate directly or through the die pad. The semiconductor device is sealed with resin or the like with part of the leads and an end surface of the heat radiation block/plate left exposed or with part of the leads left exposed.
A method for producing a semiconductor device comprising:
The method of claim 14, wherein the connecting step connects the first end of each wire of the plurality of wires to the inner portion of each of the subset of the plurality of leads at a location which is at least a distance of T from the inner edge of the insulator toward the semiconductor element, T being a thickness of the insulator.
A method for producing a semiconductor device comprising:
Dependencies are inferred from the claim text.