Method and system for dividing analyzing region in device simulator
AssigneeNEC Corporation
InventorYutaka Akiyama
Life of this patent
Estimating the term…
Abstract
In order to divide an analyzing region in a semiconductor device into a plurality of fractional elements of a predetermined configuration, the analyzing region is initially divided into an arbitrary number of the fractional elements. With respect to a newly added nodal point, the fractional elements enclosing the new nodal point within a circumscribing range thereof are extracted as objective fractional elements for further division. Among the extracted fractional elements, specific fractional element having the perimetric fraction located within a predetermined modifying the perimeter of the fractional element group consisted of the extracted fractional elements. The fractional elements are re-establishes on the basis of the modified perimeter and the new nodal point.
Claims18
A method for dividing an analyzing region of a semiconductor device into a plurality of tetrahedral elements of a predetermined configuration, comprising the steps of:
- (a) initially dividing said analyzing region into a plurality of tetrahedral elements;
- (b) adding a new nodal point at a position within said analyzing region;
- (c) retrieving from said plurality of tetrahedral elements each tetrahedral element having a circumscribed sphere enclosing said new nodal point by comparing a distance between a center of the circumscribed sphere and the new nodal point with a radius of the circumscribed sphere;
- (d) among the retrieved tetrahedral elements, retrieving said tetrahedral elements having an outermost triangular plane at an outermost position as outermost tetrahedral elements;
- (e) judging whether a distance between the outermost triangular plane of each of said outermost tetrahedral elements and said new nodal point is within a predetermined distance range;
- (f) deleting said outermost tetrahedral elements having the outermost triangular plane from the retrieved outermost tetrahedral elements when said distance is within the predetermined distance range;
- and
- (g) establishing new tetrahedral elements by connecting said new nodal point with peaks of said retrieved tetrahedral elements excluding deleted tetrahedral elements.
A method for dividing an analyzing region of a semiconductor device into a plurality of tetrahedral elements of a predetermined configuration, comprising the steps of:
- (a) initially dividing said analyzing region into a plurality of tetrahedral elements;
- (b) adding a new nodal point at a position within said analyzing region;
- (c) retrieving from said plurality of said tetrahedral elements each tetrahedral element having a circumscribed sphere enclosing said new nodal point by comparing a distance between a center of the circumscribed sphere and the new nodal point with a radius of the circumscribed sphere;
- (d) among the retrieved tetrahedral elements, retrieving said tetrahedral elements having an outermost triangular plane at an outermost position as outermost tetrahedral elements;
- (e) judging whether the distance between the outermost triangular plane of each of said outermost tetrahedral elements and said new nodal point is within a predetermined distance range;
- (f) when said distance is within the predetermined distance range, adding to the retrieved outermost tetrahedral elements new tetrahedral elements which interface with said tetrahedral elements having the outermost triangular plane of said tetrahedral elements;
- and
- (g) establishing new tetrahedral elements by connecting said new nodal point with peaks of said retrieved tetrahedral elements and said new tetrahedral elements.
A system for dividing an analyzing region of a semiconductor device into a plurality of tetrahedral elements of a predetermined configuration, comprising:
- first means for initially dividing said analyzing region into a plurality of tetrahedral elements;
- second means for adding a new nodal point at a position within said analyzing region;
- third means for retrieving from said plurality of tetrahedral elements each tetrahedral element having a circumscribed sphere enclosing said new nodal point by comparing a distance between a center of the circumscribed sphere and the new nodal point with a radius of the circumscribed sphere;
- fourth means for retrieving, among the retrieved tetrahedral elements, said tetrahedral elements having an outermost triangular plane at an outermost position as outermost tetrahedral elements;
- fifth means for judging whether a distance between the outermost triangular plane of each of said outermost tetrahedral elements and said new nodal point is within a predetermined distance range;
- sixth means for deleting said outermost tetrahedral elements having the outermost triangular plane from the retrieved outermost tetrahedral elements when said distance is within the predetermined distance range;
- and
- seventh means for establishing new tetrahedral elements by connecting said new nodal point with peaks of said retrieved tetrahedral elements excluding deleted tetrahedral elements.
A system for dividing an analyzing region in a semiconductor device into a plurality of tetrahedral elements of a predetermined configuration, comprising:
- first means for initially dividing said analyzing region into a plurality of tetrahedral elements;
- second means for adding a new nodal point at a position within said analyzing region;
- third means for retrieving from said plurality of tetrahedral elements each tetrahedral element having a circumscribed sphere enclosing said new nodal point by comparing a distance between a center of the circumscribed sphere and the new nodal point with a radius of the circumscribed sphere;
- fourth means for retrieving, among the retrieved tetrahedral elements, said tetrahedral elements having an outermost triangular plane at an outermost position as outermost tetrahedral elements;
- fifth means for judging whether a distance between the outermost triangular plane of each of said outermost tetrahedral elements and said new nodal point is within a predetermined distance range;
- sixth means for adding to the retrieved outermost tetrahedral elements, when said distance is within the predetermined distance range, new tetrahedral elements which interface with said tetrahedral elements having the outermost triangular plane of said tetrahedral elements;
- and
- seventh means for establishing new tetrahedral elements by connecting said new nodal point with peaks of said retrieved tetrahedral elements and said new tetrahedral elements.
Dependencies are inferred from the claim text.