Semiconductor clock signal generation circuit
AssigneeKabushiki Kaisha Toshiba
InventorsTomohiro Kobayashi, Yukihiro Fujimoto
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AssigneeKabushiki Kaisha Toshiba
InventorsTomohiro Kobayashi, Yukihiro Fujimoto
Estimating the term…
A clock signal generating circuit is capable of testing a delay line loop (DLL) circuit by a method wherein, when an LSI circuit operates at a lower speed for a burn-in test, etc., the DLL circuit performs the same operation as when the LSI circuit operates normally at a high speed. This invention includes a selector for selecting either a reference clock signal or a test clock signal having a different phase with respect to the reference clock signal, and a delay line loop system phase-locked loop circuit for giving a delay to an output signal of the selector so as to get rid of a phase difference between the reference clock signal and an internal clock signal that has been propagated through a circuit to be supplied with a clock, and for generating the clock signal to be supplied to the circuit.
In an integrated circuit with an internal circuit, a clock signal generating circuit comprising:
In an integrated circuit with first and second internal circuits, a multi-phase clock signal generating circuit comprising:
In an integrated circuit with an internal circuit, a clock signal generate circuit comprising:
In an integrated circuit with first and second internal circuits, a multi-phase clock signal generating circuit comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.