Probe card locking device of a probe station for testing a semiconductor wafer
AssigneeHyundai Electronics Industries Co., Ltd.
InventorDong-Seck Lee
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Abstract
A probe card locking device for a probe station performs a characteristics test or the like by contacting probes to respective dies of a wafer subjected to a predetermined unit process in a semiconductor analysis system. A pair of cylinders operated by air supplied to the probe system upwardly and downwardly operate support members respectively connected to the cylinders to lock probe cards to frames. Thus, the damage upon the probe card and inferior wafer resulting from the possible drop of the pressing bolt is prevented to enhance stability when operating the system.
Claims3
A probe card locking device for a probe station for testing a semiconductor wafer comprising:
- a pair of frames disposed in parallel with each other by a prescribed distance with respect to a lower portion of a test head of a main body of said probe station;
- a pair of pressing guides respectively fixed to opposing planes of said frames and provided with support steps for supporting opposite sides of a probe card;
- a pair of pressing members provided with pressing steps for downwardly pressing to fix the opposite sides of said probe card having said opposite sides supported by said support steps by being supported by said respective pressing guides;
- a pair of air cylinders provided to both sides of an E-beam gun placed with respect to said lower portion of said test head for being synchronously moved;
- and
- a pair of middle plates connected to said air cylinders, for supporting a plurality of elevation shafts connected to said pressing members via a pair of thruholes respectively formed in said frames.
Dependencies are inferred from the claim text.