Scanning probe microscope
AssigneeMolecular Imaging Corporation
InventorsStuart M. Lindsay, Tianwei Jing
Life of this patent
Estimating the term…
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AssigneeMolecular Imaging Corporation
InventorsStuart M. Lindsay, Tianwei Jing
Estimating the term…
Features for incorporation with scanning probe microscopes are provided which may be used separately or together. The features include constructing the microscope with a hinged top housing providing easy access to the heart of the microscope; a self-aligning and torque limiting magnetic clutch coupling a motor drive powering at least one vertical adjustment screw of the microscope; a removable microscope head for easy adjustment; an optical microscope, optionally mounted to an electronic camera and imaging system, installed adjacent to the head; operation on an inverted microscope stage; bowing error correction; a gas sparging system providing contaminant and noise reduction; a glove box type of loading system so that reactive materials may be safely loaded into the microscope; and a compact desk-top chamber which provides acoustic and vibration isolation.
A scanning probe microscope comprising:
A scanning probe microscope comprising:
A scanning probe microscope comprising:
Dependencies are inferred from the claim text.