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AssigneeTeradyne, Inc.
InventorsDaniel C. Proskauer, Mogens Ravn, Kevin G. Hood, Thomas G. Amann, Thomas B. Westbom
Estimating the term…
An electronic circuit tester for performing digital signal processing on signals generated by an electronic circuit including a multi-processor test computer, a plurality of driver/receiver channels, a plurality of capture instruments, and a plurality of high speed data paths. Capture instruments are programmed by the tester to sample a signal generated by an electronic circuit under test, convert the samples to digital form if necessary, and store the data samples in memory. The data samples are then moved from the memory of the capture instruments to the main memory of the multi-processor for analysis using digital signal processing techniques. After the initial group of data samples are moved from the capture instruments to main memory, subsequent programming of capture instruments and sampling of signals are performed concurrently with the movement and analysis of data samples. Multiple processors and multiple high speed data paths are preferably used to optimize test program throughput.
A method of performing digital signal processing on data samples using a plurality of processors, used for testing an electronic circuit, comprising the steps of:
An electronic circuit tester, having a plurality of test pins connected to a plurality of nodes on a circuit under test, for performing digital signal processing on electronic signals producedby the circuit under test, thereby determining whether the circuit under test is functioning properly, comprising:
Dependencies are inferred from the claim text.