Method and system for dividing analyzing region in device simulator

A system for dividing a region to be analyzed in a semiconductor device comprising:

• means for performing an initial division with respect to the region to be analyzed in the semiconductor device for initially dividing said region to be analyzed into a plurality of fractional elements of a predetermined configuration;
• means for generating adjacent element information for the plurality of fractional elements established by the initial division performing means;
• means for adding a new nodal point to a predetermined region to be analyzed in the semiconductor device;
• means for retrieving one fractional element having a circumscribed region enclosing said new nodal point as a specific fractional element;
• means for retrieving surrounding other fractional elements adjacent said specific fractional element and having a circumscribed region enclosing said new nodal point for establishing a fractional element group of retrieved fractional elements;
• means for re-establishing said fractional elements as newly established fractional elements in the region defined by a boundary of said fractional element group on the basis of said boundary of said fractional element group and said new nodal point as a peak of respective fractional elements;
• and
• means for adding adjacent element information for respective ones of said newly established fractional elements;
• the means for retrieving surrounding other fractional elements comprising
• means for making a judgment outwardly on a one-by-one basis whether a circumscribed region of the surrounding other fractional elements adjacent the specific fractional element encloses the new nodal point and
• means for repeating the judgment until the judgment is completed for all the surrounding other fractional elements having a circumscribed region enclosing the new nodal point.