Memory device circuit and method for concurrently addressing columns of multiple banks of multi-bank memory array
AssigneesUnited Memories, Inc., Nippon Steel Semiconductor Corporation
InventorsMichael Parris, H. Kent Stalnaker
Life of this patent
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Abstract
A circuit and method for a memory device, such as a synchronous dynamic random access memory (SDRAM) having at least two memory banks. Columns of at least two memory banks are concurrently addressable to permit data to be written to, or read from, the at least two memory banks concurrently. By writing data concurrently to more than one memory bank, testing of the memory of the memory device can be effectuated in a reduced period of time. Data can also be written or read from a single bank in a multi-bank RAM without requiring that a particular bank be specified during a read/write command.
Claims19
In a synchronous dynamic random access memory device, having a multi-bank memory array and addressing circuitry for individually addressing a row and a column of memory banks of the multi-bank memory array, a combination with the addressing circuitry of a test enabling circuit for enabling concurrent addressing of at least two columns of memory cells of at least two of the memory banks, said test enabling circuit comprising:
- multi-bank addressing mode signal circuitry coupled to receive a multi-bank addressing mode signal and a column address enable signal, said multi-bank addressing mode signal circuitry for generating multi-bank address select signals when the multi-bank addressing mode signal and the column address enable signal are concurrently received thereat;
- and
- column address select signal generating circuitry coupled to receive the multi-bank address select signals generated by said multi-bank addressing mode signal circuitry, said column address select signal generating circuitry for generating column address select signals enabling the concurrent addressing and testing of the memory cells of the at least two columns of the at least two memory banks when the multi-bank address select signals are generated.
A bank logic circuit for testing a memory device having a multi-bank memory array formed of rows and columns of memory cells, the memory cells forming at least a first memory bank of memory cells and a second memory bank of memory cells, said bank logic circuit comprising:
- command signal receiving circuitry coupled to receive indications of a test request to concurrently address columns of memory cells of the first memory bank and columns of memory cells of the second memory bank;
- and
- bank column enabling circuitry coupled to said command signal receiving circuitry, said bank column enabling circuitry for generating column address select signals enabling concurrent addressing and testing of said columns of memory cells of the first memory bank and said columns of memory cells of the second memory bank responsive to times in which said command signal receiving circuitry receives the indications of the request to concurrently address the columns of the memory cells of the first and second memory banks, respectively.
A method for testing the memory cells that are within the memory banks of a multi-bank memory array by selectively and concurrently addressing a plurality of columns of the memory cells of the memory banks of the multi-bank memory array of a memory device, said method comprising the steps of:
- applying a multi-bank addressing mode signal to the memory device;
- during said step of applying, generating column address select signals, to enable addressing of selected columns of selected memory banks of the multi-bank memory array;
- and
- concurrently addressing and testing memory cells located in the selected columns of the memory banks selected by the column address select signal generated during said step of generating.
Dependencies are inferred from the claim text.