Signal measurement method and signal measurement apparatus
AssigneeSony Corporation
InventorsMasayoshi Kanno, Mariko Okumura
Life of this patent
Estimating the term…
Abstract
A signal measurement apparatus is provided which does not require a special pattern to measure and evaluate reproduced data of a digital signal. RF data, which is binary-coded data obtained by reproducing digital recorded signal, and latch data obtained by latching the RF data in response to a reproduction clock signal reproduced by using the RF data are supplied through a signal input terminal thereof and respectively supplied to a first-pattern-length detection section and a second-pattern-length detection section so that the pattern lengths of predetermined patterns are measured. Then, a 2D display section plots the first pattern lengths on the X axis and the second pattern lengths on the Y axis to 2D-display the first and second pattern lengths.
Claims12
A signal measurement method comprising the steps of:
- detecting a first pattern length which corresponds to an interval between first edges of digital binary-coded data;
- detecting a second pattern length which corresponds to an interval between second edges;
- and
- performing 2D display such that the first pattern length is made to be input to the X axis and the second pattern length is made to be input to the Y axis.
A signal measurement apparatus comprising:
- first-pattern-length detection means for detecting a first pattern length which corresponds to an interval between first edges of digital binary-coded data;
- second-pattern-length detection means for detecting a second pattern length which corresponds to an interval between second edges;
- and
- 2D display means for performing 2D display such that the first pattern length is made to be input to the X axis and the second pattern length is made to be input to the Y axis.
Dependencies are inferred from the claim text.