Method and apparatus for profiling surfaces using diffracative optics
AssigneeZygo Corporation
InventorPeter de Groot
Life of this patent
Estimating the term…
Loading patent…
AssigneeZygo Corporation
InventorPeter de Groot
Estimating the term…
Optical system for measuring surface topography, comprised of a light source (30), a diffractive optical assembly (70,72,73) comprised of two or more diffraction gratings, holograms or like diffractive optics (120, 130;122, 132;123, 133), electronic detection means and digital signal processing means (10, 110) for determining surface height from interference data. The diffractive optical assembly (70,72,73) divides the incident light into two beams (150,160;152,162;153,163), which subsequently impinge upon the object (20) at the same place on the object surface (70) but at two different angles of incidence. After reflection from the object surface, the beams pass separately back through the diffractive optical assembly (70,72,73), after which they combine once again and form an interference pattern representative of the surface topography. The equivalent wavelength of the resultant interference pattern is much greater than the illumination wavelength.
A method for profiling an object surface using desensitized interference fringes comprising the steps of
An optical surface profiler for profiling an object surface using desensitized interference fringes, said profiler comprising an illumination source;
Dependencies are inferred from the claim text.