Apparatus for displaying a test pattern by repeating a unit picture and method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorSoon-doo Kim
Life of this patent
Estimating the term…
Abstract
A test pattern display apparatus and method thereof for adjusting the display parameters of a television picture, font data in the form of a test pattern stored in a font memory. The test pattern can be internally generated and displayed as needed, by a key input. The microcomputer repeatedly reads the font data of the selected test pattern, to form an entire test pattern, whenever accurate picture adjustments is desired.
Claims5
A test pattern display apparatus for use in a television, said apparatus comprising:
- storage means for storing font data of a unit picture of a test pattern having a predetermined shape, said unit picture constituting portions of horizontal lines of a video frame and portions of vertical lines of the video frame;
- control means for repeatedly reading said stored font data of the unit picture and repeatedly outputting a drive signal corresponding to the read font data, thereby outputting data of one frame of said test pattern;
- drive means for converting said output drive signal into an image signal and outputting the converted image signal;
- and
- display means for displaying the converted image signal as said test pattern.
A test pattern displaying method for displaying at least one type of test pattern for picture adjustment by storing font data of a unit picture for forming said at least one type of test pattern, said method comprising the steps of:
- selecting a test pattern type according to a key input;
- repeatedly reading the stored font data of the unit picture constituting portions of horizontal lines of a video frame and portions of vertical lines of the video frame according to said selected test pattern type thereby outputting data of one frame of the test pattern;
- forming the test pattern corresponding to the selected pattern type based upon the repeatedly read font data;
- and
- displaying the formed test pattern.
Dependencies are inferred from the claim text.