Apparatus and method for measuring quiescent current utilizing timeset switching

A process for use with a circuit testing apparatus having a vector generator which provides a sequence of vectors to a circuit at a rate responsive to a timeset, the vectors being associateable with a quiescent current measurement, a power supply which provides quiescent current to the circuit and a current monitor which measures the current provided to the circuit, the process comprising:

• providing current to the circuit being tested;
• associating at least one vector in the sequence with a quiescent current measurement;
• retrieving a first plurality of vectors from the sequence of vectors which are not associated with a quiescent current measurement;
• setting the timeset of the vector generator so that the vector generator provides the first plurality of vectors to the circuit being tested at a first rate;
• executing the first plurality of vectors with the circuit being tested whereby a predetermined state of the circuit is achieved;
• retrieving the at least one vector in the sequence which is associated with a quiescent current measurement and setting the timeset to a second rate, the second rate being slower than the first rate;
• providing the at least one vector to the circuit being tested at the second rate;
• executing the at least one vector with the circuit being tested;
• and
• measuring the quiescent current of the circuit while the circuit being tested is executing the at least one vector.