Inspecting a conductive object with a steady state magnetic field and induced eddy current
AssigneeAtlantic Richfield Company
InventorsKeith W. Katahara, Pedro F. Lara, Kenneth R. Riggs
Life of this patent
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AssigneeAtlantic Richfield Company
InventorsKeith W. Katahara, Pedro F. Lara, Kenneth R. Riggs
Estimating the term…
There is provided a transient electromagnetic method and apparatus for inspecting objects. The apparatus includes a sensing portion, which has a transmitting antenna and at least one receiving antenna thereon. The sensing portion is located adjacent to the object which is to be inspected such that the antennas are adjacent to the object. There is also a magnet located adjacent to the sensing portion. The magnet has poles located adjacent to the object, so as to provide a steady-state magnetic field to the object. By applying a steady-state magnetic field to the object during inspection, increased inspection speeds and improved spatial resolutions can be achieved. In addition, casing can be inspected from inside of tubing.
A method of inspecting a conductive object, comprising the steps of:
A method of inspecting a conductive object through a conductive shield, comprising the steps of:
An apparatus for inspecting a conductive object, comprising:
Dependencies are inferred from the claim text.