Semiconductor device with pad electrode
AssigneeKabushiki Kaisha Toshiba
InventorHisao Yamaguchi
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AssigneeKabushiki Kaisha Toshiba
InventorHisao Yamaguchi
Estimating the term…
An N.sup.- -type epitaxial layer is formed on a P-type semiconductor substrate. A P-type region is formed in the N.sup.- -type epitaxial layer. First and second N.sup.- -type layer islands, isolated by the P-type region, are formed in the N.sup.- -type epitaxial layer. An N.sup.+ +-type contact region is formed in a surface region of the first N.sup.- -type layer island. A pad electrode is formed above the first N.sup.- -type layer island with an oxide film interposed therebetween. A polysilicon layer serving as a resistor is formed above the second N.sup.- -type layer island with the oxide film interposed therebetween. A first conductive layer for electrically connecting the polysilicon layer with the N.sup.+ -type contact region is formed on the polysilicon layer, the N.sup.+ -type contact region and the oxide film. A second conductive layer for electrically connecting the polysilicon layer with a stable high-potential power source is formed on the oxide film and the polysilicon layer.
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.