Humidity control thermal analyzer
AssigneeSeiko Instruments Inc.
InventorsNobutaka Nakamura, Ryoichi Kinoshita
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AssigneeSeiko Instruments Inc.
InventorsNobutaka Nakamura, Ryoichi Kinoshita
Estimating the term…
The humidity of the atmosphere contacting a sample and the water vapor partial pressure are program controlled and measured in a device having: a sample chamber which is provided with an inlet and an outlet for water vapor and which is capable of controlling a feedback temperature along with the sample stored therein; a warm water chamber for generating saturated water vapor pressure which has a gas inlet and an outlet connected to a pipe and which is capable of controlling the feedback temperature; a humidity program function generator for outputting a target humidity value for the sample chamber for each input time interval; a memory for storing a temperature-saturated water vapor pressure curve; and a calculator for calculating a control target temperature for the warm water chamber for generating the saturated water vapor pressure on the basis of the sample chamber target temperature output from a temperature program function generator, sample chamber target humidity of the sample chamber output from the humidity program function generator and the temperature-saturated water vapor pressure curve.
A humidity control thermal analyzer comprising:
A humidity control thermal analyzer comprising:
Dependencies are inferred from the claim text.