System and method for scan control of a programmable fuse circuit in an integrated circuit
AssigneeHewlett-Packard Company
InventorsMichael J. Bennett, Robert W. Proulx
Life of this patent
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Abstract
A scan controllable, programmable fuse circuit is provided to enable testing of an integrated circuit in its final configuration before blowing any of the fuses of the programmable fuse circuits. This is achieved by incorporating a scannable latch that is connected to the output of a programmable fuse circuit and is configured for loading the output value of the programmable fuse circuit. The output value is then latched to the output of the scannable latch. Alternatively, a programmed output value can be scanned into the scannable latch and then latched to the output of the scannable latch.
Claims16
A scan controllable, programmable fuse circuit for use in an integrated circuit and having a circuit output, comprising:
- a fuse circuit having a fuse output, said fuse circuit including a fuse that can be blown in order to change a logic level of said fuse output;
- and
- a scannable latch connected to said fuse output and configured for controlling said circuit output so as to allow output values to be loaded into said scannable latch means from said fuse output and then shifted to said circuit output, and to allow other output values to be scanned into said scannable latch means and then shifted to said circuit output.
A method for scan control of a programmable fuse circuit in an integrated circuit, comprising the steps of:
- fabricating a scannable latch connected to a fuse output of a programmable fuse circuit;
- scanning an output value into said scannable latch;
- and
- shifting said output value to an output of said scannable latch.
A scan controllable, programmable fuse circuit comprising a programmable fuse circuit with a fuse output that is connected to an input of a scannable latch.
Dependencies are inferred from the claim text.