Memory device performance by delayed power-down
AssigneeTexas Instruments Incorporated
InventorsTim M. Coffman, Ronald J. Syzdek, Timothy J. Coots, Phat C. Truong, Sung-Wei Lin
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AssigneeTexas Instruments Incorporated
InventorsTim M. Coffman, Ronald J. Syzdek, Timothy J. Coots, Phat C. Truong, Sung-Wei Lin
Estimating the term…
The method of this invention prevents transient currents at high-frequency disable cycles and disables DC current paths after a minimum delay time, thereby reducing power dissipation. This invention includes a delay circuit functioning to prevent disablement of DC paths where chip-disable times occur at intervals below a minimum duration. The result is a decrease in the number of undesired voltage drops on internal power buses due to transient currents. The method detects external chip-disable pulses that occur before a minimum time duration, then prevents those pulses from powering down internal direct-current paths. At the same time, the output driver high impedance functionality of the chip-disable signal is preserved.
A method of reducing voltage on power busses of an integrated circuit caused by short chip-disable durations, said method comprising:
A method for reducing power consumption in an integrated circuit having at least one address buffer, sense amplifiers and output drivers, each said address buffer, sense amplifiers and output drivers having a disabling input, said integrated circuit including a chip-disabling signal and an output-disable signal, said method comprising:
A circuit for reducing power consumption in an integrated circuit, said circuit comprising:
Dependencies are inferred from the claim text.