Noise generator for evaluating mixed signal integrated circuits

Abstract

A method and apparatus for generating noise to be used in evaluation and testing of digital or analog integrated circuits. One or more noise generators fabricated on a substrate generate noise representative of the digital switching noise generated by a digital integrated circuit. The noise generator may be programmable to generate noise over a wide frequency and amplitude range. In addition, a plurality of noise generators may be used to independently and simultaneously generate noise signals with multiple frequencies and amplitudes. A test circuit, either analog or digital, is fabricated on the same substrate. The generated noise signal(s) are generated for use in the evaluation and testing of the effects of the noise on the analog or digital test circuit.

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