Solder interconnection structure and process for making
AssigneeInternational Business Machines Corporation
InventorsFrederick Richard Christie, Kostas I. Papathomas, David Wei Wang
Life of this patent
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Abstract
Solder interconnection encapsulant, encapsulated structure and method for its fabrication and use, whereby the gap created by solder connections between a carrier substrate and a semiconductor device is filled with a composition obtained from curing a preparation containing a cycloaliphatic polyepoxide and/or curable cyanate ester or prepolymer thereof; filler, e.g., an aluminum nitride or aluminum oxide filler, having a maximum particle size of 31 microns.
Claims24
A method of increasing the fatigue life of solder interconnections between a semiconductor device and a supporting substrate comprising attaching said device to said substrate by a plurality of solder connections that extend from the supporting substrate to electrodes on said semiconductor device to form a gap between said supporting substrate and said semiconductor device;
- filling said gap with a composition that contains:
- A. binder selected from the group of a cycloaliphatic epoxide, cyanate ester, prepolymer of cyanate ester and mixtures thereof, said binder having a viscosity at room temperature of no greater than about 5,000 centipoise;
- B. filler chosen from the group consisting of aluminum oxide, aluminum nitride, silicon nitride, silicon carbide, beryllium oxide, boron nitride, and diamond powder, said filler having a maximum particle size of 31 microns;
- wherein the amount of A is about 60 to about 25 percent by weight of the total of A and B, and correspondingly the amount of B is about 40 to about 75 percent by weight based upon the amount of A and B;
- and
- curing said composition.
Dependencies are inferred from the claim text.