Polycrystalline silicon semiconductor having an amorphous silicon buffer layer
AssigneeCanon Kabushiki Kaisha
InventorShunichi Ishihara
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Abstract
A defect-free semiconductor device having a stacked layer structure formed on a substrate made of a material different from crystalline silicon, said stacked layer structure comprising an amorphous silicon layer on said substrate as a buffer layer and a polycrystalline silicon semiconductor active layer with a multilayered structure disposed on said amorphous silicon layer, said multilayered structure having at least a first polycrystalline silicon layer in non-junction forming contact with said amorphous silicon layer and a second polycrystalline silicon layer having a conductivity type opposite the conductivity type of said first polycrystalline silicon layer.
Claims13
A semiconductor device having a stacked layer structure on a substrate made of a material different from crystalline silicon, said stacked layer structure comprising an amorphous silicon layer having an n- or p-type conductivity on said substrate as a buffer layer and a polycrystalline silicon semiconductor active layer with a multilayered structure disposed on said amorphous silicon layer, said multilayered structure having at least a first polycrystalline silicon layer in non-junction forming contact with said amorphous silicon layer and a second polycrystalline silicon layer having a conductivity type opposite to the conductivity type of said first polycrystalline silicon layer.
A semiconductor device having a stacked layer structure on a substrate made of a material different from crystalline silicon and a collecting electrode disposed on said stacked layer structure, said stacked layer structure comprising an amorphous silicon layer having an n- or p-type conductivity on said substrate as a buffer layer and a polycrystalline silicon semiconductor active layer with a multilayered structure disposed on said amorphous silicon layer, said multilayered structure having at least a first polycrystalline silicon layer in non-junction forming contact with said amorphous silicon layer and a second polycrystalline silicon layer having a conductivity type opposite to the conductivity type of said first polycrystalline silicon layer.
Dependencies are inferred from the claim text.