Method and apparatus for reducing afterglow noise in an X-ray inspection system

A method of reducing afterglow noise during inspection of an object by an X-ray inspection system, said method comprising the steps of:

• generating X-ray pulses at a rate of least 2,000 pulses per second, wherein each of said pulses has a time duration that is substantially less than a separation of time between adjacent of said pulses;
• intercepting said X-ray pulses using a scintillating screen optically coupled to a plurality of photoemissive detecting elements of a detector, each of said photoemissive detecting elements generating an electrical output signal in response to visible light produced by said scintillating screen;
• and
• sampling said outputs of said plurality of photoemissive detecting elements during said duration of time of said X-ray pulses to reduce the afterglow noise of said system.

Apparatus for reducing afterglow noise during inspection of an object by an X-ray inspection system, said apparatus comprising:

• means for generating X-ray pulses at rate of at least about 2,000 pulses per second, wherein each of said pulses has a time duration that is substantially less than a separation of time between adjacent of said pulses;
• means for intercepting said X-ray pulses using a scintillating screen optically coupled to a plurality of photoemissive detecting elements of a detector, said photoemissive detecting elements generating current at outputs thereof in response to visible light produced by said scintillating screen;
• and
• means for sampling said outputs of said plurality of photoemissive detecting elements during said duration of time of said X-ray pulses to thereby reduce the afterglow noise of said system.