Method and apparatus for exposure control in light-based measurement instruments
AssigneeCyberOptics Corporation
InventorsEric P. Rudd, Timothy A. Skunes
Life of this patent
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Abstract
A method and apparatus for nearly instantaneous and wide dynamic range exposure control in light-based measurement instruments. The excess charge drained from a CCD array by anti-blooming circuitry is effectively monitored and distinguished from leakage current. Detection of the drained charge generates a signal to deactivate the light source exposing the CCD array. The exposure control device includes a unique circuit for detecting the operating state of an anti-blooming circuit associated with a CCD array, and a unique laser light driver that ramps up the light intensity of the laser light source in an approximately exponential manner.
Claims2
A circuit for detecting the operating state of an anti-blooming circuit associated with a CCD array, the CCD array having an operating range including a normal operating range and a saturated operating range and the anti-blooming circuit being adapted for maintaining the CCD array within the normal operating range when said CCD array is exposed to light, by draining excess charge generated by the CCD array during a light exposure cycle, comprising:
- integrator means operably coupled to file said anti-blooming circuit for accumulation of said excess charge;
- comparator means operably coupled to said integrator means for determining when said excess charge reaches a predetermined threshold and generating a signal to end said exposure cycle;
- leakage current differentiating means operably coupled to said integrator means for differentiating said excess charge from leakage currents;
- and
- integrator reset means for resetting said integrator when said exposure cycle is ended.
Dependencies are inferred from the claim text.