Method to analyze particle contaminants in compressed gases
AssigneeAmerican Air Liquide, Inc.
InventorsHwa-chi Wang, Richard J. Udischas
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Abstract
A system and a method for analyzing impurities in compressed gas, a method for controlling the particle growth in the monitored gas and a method for determining the optimum monitoring temperature for an individual gas are disclosed. The system includes a source of compressed gas, a sensor for measuring particle impurity within the gas, a temperature controller for controlling the temperature of the gas prior to said gas entering the sensor, with the temperature being controlled to eliminate particle formation from molecular clustering and condensation, and a pressure balancer.
Claims10
A system for analyzing impurity in compressed gas, comprising a sensor for measuring said impurity within said gas, a temperature controller for controlling the temperature of said gas in a temperature zone prior to said gas entering said sensor, a pressure balancer comprising a first valve located between a source of said compressed gas and said sensor, a second valve for introducing said gas to said system, a filter located downstream of said second valve for substantially removing impurities in the source gas and/or introduced by the upstream components, a third valve located downstream from said filter for controlling the exhaust of the gas from the system, and an orifice located between said filter and sensor for back-filling said gas to said sensor until there is a pressure equilibrium across said first valve.
Dependencies are inferred from the claim text.