US 5,663,502 AGranted

Method and apparatus for measuring thickness of layer using acoustic waves

AssigneesHitachi, Ltd., Hitachi Nuclear Engineering Co., Ltd.

InventorsYoshiaki Nagashima, Kenichi Fujiwara, Masao Sato, Fuminobu Takahashi, Masahiro Koike, Hajime Umehara, Yoshihiro Michiguchi

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Abstract

Ultrasonic waves from a transmit device are transmitted to an object subject to measurement. A surface reflected wave propagated in a contact medium and reflected at the surface of a tube and bottom surface reflected waves passing through an oxidation layer on the tube and reflected at the inner surface of the tube are convened into electric signals. A feature extracting part 5, in consideration of a correlation relationship of energy with respect to the frequency of a received signal, based on the received signal of ultrasonic waves converted to electric signals, extracts a signal feature data determined beforehand which has a strong correlation relationship with the thickness of a measured part. Based on the extracted signal feature data, a thickness conversion part references a relationship storage part which has stored therein beforehand a function that shows a relationship between the signal feature data and the thickness of the oxidation layer, and obtains the thickness of the oxidation layer.

Claims8

Dependent claims

A method for measuring a thickness of a layer on a front surface of a test object using acoustic waves, the method comprising the steps of:

transmitting respective acoustic waves to a plurality of reference objects having respective front surfaces with respective layers thereon, the layers of the reference objects being of a same type as the layer of the test object and having respective known mutually different thicknesses;
receiving respective acoustic waves from the reference objects, the acoustic waves received from the reference objects having been produced by the acoustic waves transmitted to the reference objects and being one of
(1) reflected acoustic waves which have passed through the reference objects and have been reflected from respective back surfaces of the reference objects at least once, and
(2) transmitted acoustic waves which have passed through the reference objects at least once;
determining respective frequency spectrums of the acoustic waves received from the reference objects;
determining respective centers-of-frequency of the frequency spectrums of the acoustic waves received from the reference objects;
determining a thickness function defining a relationship between the centers-of-frequency of the frequency spectrums of the acoustic waves received from the reference objects and the thicknesses of the layers of the reference objects;
transmitting an acoustic wave to the test object;
receiving an acoustic wave from the test object, the acoustic wave received from the test object having been produced by the acoustic wave transmitted to the test object and being one of
(1) a reflected acoustic wave which has passed through the test object and has been reflected from a back surface of the test object at least once, and
(2) a transmitted acoustic wave which has passed through the test object at least once;
determining a frequency spectrum of the acoustic wave received from the test object;
determining a center-of-frequency of the frequency spectrum of the acoustic wave received from the test object;
and
determining the thickness of the layer of the test object from the thickness function based on the center-of-frequency of the frequency spectrum of the acoustic wave received from the test object.

12 more elements

A method for measuring a thickness of a layer on a front surface of a test object using acoustic waves, the method comprising the steps of:

transmitting respective acoustic waves to a plurality of reference objects having respective front surfaces with respective layers thereon, the layers of the reference objects being of a same type as the layer of the test object and having respective known mutually different thicknesses;
receiving respective first acoustic waves and respective second acoustic waves from the reference objects, the first acoustic waves and the second acoustic waves received from the reference objects having been produced by the acoustic waves transmitted to the reference objects and being one of
(1) reflected acoustic waves which have passed through the reference objects and have been reflected from respective back surfaces of the reference objects at least once, and
(2) transmitted acoustic waves which have passed through the reference objects at least once,
the second acoustic waves received from the reference objects having passed through the reference objects a greater number of times than the first acoustic waves received from the reference objects;
determining respective frequency spectrums of the first acoustic waves and the second acoustic waves received from the reference objects;
determining respective attenuation features for the reference objects, the attenuation features for the reference objects being determined between the frequency spectrums of the first acoustic waves received from the reference objects and the frequency spectrum of the second acoustic waves received from the reference objects, the attenuation features for the reference objects being approximated by an attenuation feature function having a coefficient, a value of the coefficient of the attenuation feature function being different for each of the attenuation features for the reference objects;
determining respective values of the coefficient of the attenuation feature function for the attenuation features for the reference objects;
determining a thickness function defining a relationship between the values of the coefficient of the attenuation feature function for the attenuation features for the reference objects and the thicknesses of the layers of the reference objects;
transmitting an acoustic wave to the test object;
receiving a first acoustic wave and a second acoustic wave from the test object, the first acoustic wave and the second acoustic wave received from the test object having been produced by the acoustic wave transmitted to the test object and being one of
(1) a reflected acoustic wave which has passed through the test object and has been reflected from a back surface of the test object at least once, and
(2) a transmitted acoustic wave which has passed through the test object at least once,
the second acoustic wave received from the test object having passed through the test object a greater number of times than the first acoustic wave received from the test object;
determining respective frequency spectrums of the first acoustic wave and the second acoustic wave received from the test object;
determining an attenuation feature for the test object, the attenuation feature for the test object being determined between the frequency spectrum of the first acoustic wave received from the test object and the frequency spectrum of the second acoustic wave received from the test object;
determining a value of the coefficient of the attenuation feature function for the attenuation feature for the test object;
and
determining the thickness of the layer of the test object from the thickness function based on the value of the coefficient of the attenuation feature function for the attenuation feature for the test object.

16 more elements

An apparatus for measuring a thickness of a layer on a surface of a test object using acoustic waves, the apparatus comprising:

acoustic wave transmitting/receiving means for
transmitting an acoustic wave to the test object from a first position,
receiving an acoustic wave from the test object at a second position different from the first position, the acoustic wave received from the test object having been produced by the acoustic wave transmitted to the test object and having passed through the test object at least once, and
outputting an acoustic wave signal indicative of the acoustic wave received from the test object;
waveform extracting means for extracting a waveform from the acoustic wave signal outputted by the acoustic wave transmitting/receiving means;
frequency spectrum calculating means for calculating a frequency spectrum of the waveform extracted by the waveform extracting means;
center-of-frequency calculating means for calculating a center-of-frequency of the frequency spectrum calculated by the frequency spectrum calculating means;
thickness function storing means for storing a predetermined thickness function defining a relationship between the center-of-frequency calculated by the center-of-frequency calculating means and the thickness of the layer of the test object;
thickness converting means for converting the center-of-frequency calculated by the center-of-frequency calculating means into the thickness of the layer of the test object based on the predetermined thickness function stored in the thickness function storing means;
and
output means for outputting the thickness of the layer of the test object obtained by the thickness converting means.

8 more elements

An apparatus for measuring a thickness of a layer on a surface of a test object using acoustic waves, the apparatus comprising:

acoustic wave transmitting/receiving means for
transmitting an acoustic wave to the test object from a first position,
receiving a first acoustic wave and a second acoustic wave from the test object at a second position different from the first position, the first acoustic wave and the second acoustic wave received from the test object having been produced by the acoustic wave transmitted to the test object and having passed through the test object at least once, the second acoustic wave received from the test object having passed through the test object a greater number of times than the first acoustic wave received from the test object, and
outputting a first acoustic wave signal indicative of the first acoustic wave received from the test object and a second acoustic wave signal indicative of the second acoustic wave received from the test object;
waveform extracting means for extracting a first waveform from the first acoustic wave signal outputted by the acoustic wave transmitting/receiving means and a second waveform from the second acoustic wave signal outputted by the acoustic wave transmitting/receiving means;
frequency spectrum calculating means for calculating a first frequency spectrum of the first waveform extracted by the waveform extracting means and a second frequency spectrum of the second waveform extracted by the waveform extracting means;
attenuation feature calculating means for calculating an attenuation feature between the first frequency spectrum calculated by the frequency spectrum calculating means and the second frequency spectrum calculated by the frequency spectrum calculating means, the attenuation feature being approximated by an attenuation feature function having a coefficient, and calculating a value of the coefficient of the attenuation feature function;
thickness function storing means for storing a predetermined thickness function defining a relationship between the coefficient of the attenuation feature function calculated by the attenuation feature calculating means and the thickness of the layer of the test object;
thickness converting means for converting the coefficient of the attenuation feature function calculated by the attenuation feature calculating means into the thickness of the layer of the test object based on the predetermined thickness function stored in the thickness function storing means;
and
output means for outputting the thickness of the layer of the test object obtained by the thickness converting means.

8 more elements

Dependencies are inferred from the claim text.