Semiconductor device with bump structure
AssigneeNippondenso Co., Ltd.
InventorsIchiharu Kondo, Chikage Noritake, Yusuke Watanabe
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AssigneeNippondenso Co., Ltd.
InventorsIchiharu Kondo, Chikage Noritake, Yusuke Watanabe
Estimating the term…
A semiconductor device, which has a high adhesiveness to the Cu film and the barrier metal at the bump part or LSI wiring part of a flip chip, is disclosed. On a silicon substrate are formed a transistor as a functional element and a bump for making contact with the transistor and an external substrate. On the surface of the silicon substrate is formed a metallic film, and on the metallic film is formed an insulating film, and a part of the metallic film is exposed through a contact hole. On the metallic film within the contact hole is formed a barrier metal made of TiN, and on the barrier metal is formed a bonding layer made of Ti. On the bonding layer is formed a bump growing Cu film, and on the bump growing Cu film is formed a bump structure.
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.