Method for trapping ions into ion traps and ion trap mass spectrometer system thereof
AssigneeVarian Associates, Inc.
InventorAlex Mordehai
Life of this patent
Estimating the term…
Abstract
A method and mass spectrometer system for trapping ions within an ion trap by increasing the flight path of ions therein. An ion beam is produced by external ion source and is directed to the ion trap which comprises at least one trapping electrode in proximity to an exit region of the ion beam from the ion trap. A retarding DC voltage is applied to the trapping electrode during ion accumulation time for creating a fringing reflection field and for retaining ions within the ion trap.
Claims27
An improved ion trap mass spectrometer system for trapping ions comprising:
- an external ion source for producing an ion beam;
- an ion trap for admitting said ion beam during ion accumulation time, said ion trap having spaced apart entrance and exit regions along an axis of the ion beam;
- at least one trapping electrode placed in proximity to said exit region;
- and
- a power supply for applying a retarding DC voltage to said trapping electrode for creating a fringing reflecting field within said ion trap and for retaining said ions within said ion trap during said accumulation time, and applying a bias DC voltage to said trapping electrode during detection time.
An improved ion trap mass spectrometer system comprising:
- an external ion source for producing an ion beam;
- an ion trap positioned along an axis of said ion beam, said ion trap comprising:
- an entrance electrode with an aperture for passing said ion beam therethrough;
- an exit electrode with an orifice, said orifice facing said aperture;
- a trapping electrode placed in proximity to said orifice;
- and
- a power supply for applying DC voltage to said trapping electrode to create a fringing reflecting field within said ion trap during ion accumulation time.
A method of trapping ions produced by an external ion source into an ion trap comprising the steps of:
- directing said ions through an entrance region for said ions into said ion trap;
- providing at least one trapping electrode at an exit region for said ions from said ion trap, said entrance and exit regions being on an axis of said ion beam;
- and
- applying a retarding DC voltage to said trapping electrode during an ion accumulation time for retaining the ions within said ion trap.
A method of trapping and analyzing ions within an ion trap comprising the steps of:
- providing said ion trap with entrance and exit electrodes with respective aperture and orifice facing each other;
- positioning a trapping electrode in proximity to said orifice;
- filling said ion trap with a buffer gas;
- producing an external ion beam form an external ion source;
- directing said ion beam into said ion trap through said aperture during ion accumulation time;
- and
- applying a retarding DC voltage to said trapping electrode during said ion accumulation time.
Dependencies are inferred from the claim text.