US 5,646,538 AGranted

Method and apparatus for fastener hole inspection with a capacitive probe

AssigneeMeasurement Systems, Inc.

InventorsEdward N. Lide, Samuel R. Glidewell

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Abstract

A computer-based method and apparatus for fastener hole inspection including a capacitive probe with a plurality of sensor elements, means for grounding the faster hole, and an electronics unit electrically connected to the probe for sequencially charging one of the plurality of sensor elements while applying a guard potential to the remaining sensor elements and adjacent electrical components to eliminate residual capactitances. A profile of the fastener hole is generated by evaluating, through a series resistor, the discharge waveforms of the plurality of sensor elements by converting the capacitance measurements obtained to distance measurements. A centering algorithm is employed to compensate for malalignment of the capacitive probe in the fastener hole.

An apparatus for inspecting the surface of a fastener hole for compliance with specified dimensional standards, comprising:

(a) a capacitive probe having a tubular, dielectric housing with a plurality of sensor elements arranged circumferentially within the housing at one or more levels for insertion into the fastener hole;
(b) means for grounding the fastener hole;
(c) an electronics unit electrically connected to said probe, said electronics unit comprising
(i) a select switch for sequentially selecting one of said plurality of sensor elements thereby defining a selected sensor element and a plurality of deselected sensor elements, said select switch having an input and an output,
(ii) a deselect switch having an input and an output, the output being connected to said plurality of deselected sensor elements,
(iii) voltage generation means for momentarily charging said selected sensor element with a charging voltage whereby a capacitance is developed between the fastener hole and said selected sensor element,
(iv) a resistor electrically connected between said selected sensor element and said voltage generation means,
(v) a dual threshold window generator electrically connected to the output of said select switch for monitoring a signal representing the charging voltage applied to said selected sensor element,
(vi) counting means electrically connected to said dual threshold window generator for counting the time required for the charging voltage to decay from a first predetermined voltage level to a second predetermined voltage level,
(vii) a drive amplifier electrically connected to the output of said select switch for applying the signal representing the charging voltage to the input of said deselect switch and to adjacent electrically conductive components,
(viii) a first buffer electrically connected between said selected sensor element and said select switch, and
(ix) processor means connected to said select switch, said deselect switch, said voltage generation means, and said counting means for determining the capacitance and distance between said selected sensor element and the surface of the fastener hole whereby compliance of the surface of the fastener hole with specified dimensional standards may be evaluated;
and
(d) a data storage, processing, and retrieval means electrically connected to said processor.

11 more elements

Abstract

Claims6