Spectrometer employing a Mach Zehnder interferometer created by etching a waveguide on a substrate
AssigneeThe Research Foundation of State University of NY
InventorDarold Wobschall
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AssigneeThe Research Foundation of State University of NY
InventorDarold Wobschall
Estimating the term…
A planar optic sensor for measuring the optical absorbance spectrum of a side variety of substances in situ comprises a planar waveguide Mach-Zehnder interferometer having a reference path and a sensing path. The sensing path of the waveguide is exposed to the sample under test, the sample interacting with the guided light via emanations from the light as it propagates through the sensing path. The reference path of the waveguide is provided with a heater that linearly varies over time the refractive index of the reference path material, in this manner varying the optical path length of the reference path. Fourier spectroscopic techniques are applied to compare the spectrum of a white light source without a sample present in the sensing path to the spectrum of the white light source in the presence of a sample in the sensing path, as the optical path length of the reference path is swept over time. From these data the absorption spectrum of the sample is determined.
An interfering spectrometer comprising:
A method of using a Spectrometer Employing a Mach Zehnder Interferomter created by Etching a Waveguide on a Substrate comprising:
An interfering spectrometer comprising:
Dependencies are inferred from the claim text.