Apparatus used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities
AssigneesKabushiki Kaisha Toshiba, Purex Corporation
InventorsTuyoshi Matumura, Kunihiro Miyazaki, Hisashi Muraoka
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Abstract
An apparatus is disclosed which is used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities. The apparatus comprises a heat-resistant thin sheet containing an element or elements, as a principal component, not detected on total reflection fluorescent X-ray analysis and an x-ray source directing an X-ray as an incident X-ray at a liquid drop-like sample put on the sheet and containing very small amounts of impurities whereby the liquid drop-like sample is evaporated to a dried solid for the total reflection fluorescent X-ray analysis to be performed there.
Claims10
An apparatus used for total reflection fluorescent X-ray analysis on a sample containing very small amounts of impurities, comprising:
- a sheet having a hydrophobic and acid resistant surface formed of either one of a single element of Li, Be, and C, and a compound containing H, He, Li, Be, C, N, O, F, or Ne as a principal component and from which the fluorescent X-ray to be detected cannot be obtained when the total reflection fluorescent X-ray is applied to the sheet;
- an X-ray source for directing an X-ray as an incident X-ray at the sample on the sheet means and containing such very small amounts of impurities to allow the sample to be analyzed by total reflection fluorescent X-ray analysis;
- a fluorescent X-ray detector for detecting fluorescent X-rays produced from the sample;
- and
- a fluorescent X-ray analyzer.
Dependencies are inferred from the claim text.