Fault sensing circuit and method
AssigneeTexas Instruments Incorporated
InventorsPhat C. Truong, John F. Schreck
Life of this patent
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Abstract
A fault sensing circuit for detecting the state of at least one latch controlled by at least one control signal is provided. The circuit comprises an additional latch also controlled by the same control signal and receiving an input of a known value. The output of the additional latch is coupled to an I/O pin where an external circuit may monitor its logic state to determine the occurrence of a fault.
Claims15
A fault sensing circuit coupled to at least first, second and third I/O pads of an integrated circuit, said fault sensing circuit for providing external indication at said first I/O pad of the state of a plurality of input latches controlled by at least a RESET signal, comprising:
- a fault detection latch for receiving said RESET signal and receiving a high input signal, said fault detection latch producing an output signal at said first I/O pad in response to said RESET signal and said high input signal, said output signal indicative in one state of premature resetting of said input latch;
- and
- first and second high voltage detectors coupled to said second and third I/O pads, said high voltage detectors for receiving non-system operating voltages and for supplying said RESET signal to said input latches and to said fault detection latch, respectively.
A fault sensing circuit providing, at a pad of an integrated circuit, external indication of the state of a plurality of input latches controlled by at least a RESET signal;
- said fault sensing circuit comprising:
- at least one input latch having a data input coupled to a first I/O pad, said input latch enabled by control signals;
- a fault detection latch enabled by said control signals and having a data input connected to a constant voltage source and a data output connected to a second I/O pad, said data output providing said external indication in one state of premature resetting of said input latch;
- and
- at least one high voltage detector coupling a said control signal to said at least one input latch and to said fault detection latch in response to a high voltage signal received at a third I/O pad coupled to inputs of said at least one high voltage detector.
A method for providing, at a pad of an integrated circuit, external indication of the faults associated with input latches in said integrated circuit, said method comprising the steps of:
- forming at least one input latch receiving input from a first I/O pad and a fault detection latch receiving input from a constant voltage source;
- providing high voltage detectors for coupling control signal inputs of said at least one input and said fault detection latch to I/O pads;
- delivering an output of said fault detection latch to a second I/O pad, said external indication in one state of premature resetting of said one input latch;
- and
- monitoring the state of the second I/O pad, so that a fault produced by a variation in the control signal may be detected.
Dependencies are inferred from the claim text.