Projection optical system and projection exposure apparatus using the same
AssigneeNikon Corporation
InventorsKazuo Ushida, Sumio Hashimoto
Life of this patent
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AssigneeNikon Corporation
InventorsKazuo Ushida, Sumio Hashimoto
Estimating the term…
A projection exposure apparatus can correct focal point movement caused by an environmental change, such as a change in temperature or atmospheric pressure, during an operation, while minimizing occurrence of a new aberration such as a spherical aberration caused by focus correction. The projection exposure apparatus of this invention exposes a mask pattern on a photosensitive substrate via a projection optical system. The projection optical system includes a refraction or reflection type optical member, and a diffraction type correction optical member. The correction optical member has focal position movement with an environmental change during an operation in a direction opposite to the direction of focal position movement of the optical member with the environmental change during the operation.
A projection optical system for projecting a light beam from a first object onto a second object, comprising:
A projection exposure apparatus for transferring a pattern formed on a mask onto a photosensitive substrate, comprising:
Dependencies are inferred from the claim text.