Semiconductor device having built-in high frequency bypass capacitor
AssigneeMotorola, Inc.
InventorsJames F. Wenzel, Mona A. Chopra, Stephen W. Foster
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AssigneeMotorola, Inc.
InventorsJames F. Wenzel, Mona A. Chopra, Stephen W. Foster
Estimating the term…
A high frequency bypass capacitor (36, 36') is built into a thin-film portion (16, 16') of a polymer carrier substrate (15) of a PBGA (10). The carrier substrate (15) has both a stiffener (18) and a thin-film portion (16, 16') which has multiple metal layers (24, 28, 30, 32). The power supply planes (28, 30) of these metal layers are used to form built-in bypass capacitors (36, 36'), wherein the power supply planes are specifically designed to be adjacent and parallel layers. An ultra thin film laminate construction provides thin dielectric films (26) between the metal layers to allow the bypass capacitor to be placed very dose to the attached semiconductor die (12) to further reduce parasitic inductance and resistance between die connections (14) and the bypass capacitor. The built-in feature minimizes inherent parasitic series inductance and resistance, thus enabling the filtering of unwanted low pulse width glitches on a power plane connected to VLSI devices at operating frequencies at or above 100 MHz.
A semiconductor device comprising:
A high frequency semiconductor device, comprising:
Dependencies are inferred from the claim text.