X-ray computed tomography apparatus of the electron beam type with electron beam intensity measuring capacity
AssigneeSiemens Aktiengesellschaft
InventorsErich Hell, Manfred Fuchs
Life of this patent
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Abstract
In an x-ray beam computed tomography apparatus having a ring anode scanned by an electron beam for producing an x-ray beam which rotates around an examination region, measurement of the intensity distribution in the electron beam is enabled at various locations of the ring anode during operation. For this purpose, the ring anode can have at a number of locations around its circumferential direction, insulated sub-anodes with an insulating interspace therebetween, to which a measuring arrangement for measuring the charge distribution, and thus the intensity distribution, in the electron beam is connected. The charge distribution is measured when the electron beam sweeps the interspace between two sub-anodes.
Claims6
In an x-ray computed tomography apparatus having an annular x-ray source surrounding an examination field, said x-ray source including a ring anode scanned by an electron beam generated by an electron gun for producing an x-ray beam rotating around said examination field, the improvement comprising:
- said ring anode having, at least one location, at least two neighboring sub-anodes insulated from each other and separated by an insulating interspace;
- and
- measuring means connected to said sub-anodes for measuring a charge distribution in said electron beam as said electron beam sweeps said interspace between said two sub-anodes.
Dependencies are inferred from the claim text.