Error detection and correction circuit
AssigneeAdvanced Micro Devices, Inc.
InventorsBrendan J. Babb, Steven B. Sidman
Life of this patent
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AssigneeAdvanced Micro Devices, Inc.
InventorsBrendan J. Babb, Steven B. Sidman
Estimating the term…
The present invention addresses the need in the art by providing a novel approach to the correction of errors in check bits in an encoded data word. The invention consists of a check bit output latch 16 which stores check bits generated by a check bit generator 14 and outputs the newly generated check bits to memory 12 when a single error occurs in the word located in the check bits. The data is corrected so the newly generated check bits are correct and can be latched out to memory 12 at the same time the data is latched out. The invention includes a syndrome generator 18, an error corrector 34, and an error detector 36. The present invention provides a powerful performance boost to error detection and correction circuits by correcting check bits in memory with newly generated check bits when no errors in the data word are detected.
An improved error detection and correction circuit comprising:
An improved error detection and correction circuit for use with a device for detecting errors in stored check bits and providing an output enable signal on detection of such errors, said correction circuit comprising:
An improved error detection and correction circuit comprising:
Dependencies are inferred from the claim text.