Self-diagnostic data buffers

A self-diagnostic asynchronous data buffer, comprising:

• addressable storage means including:
• a plurality of addressable storage cells;
• data input means for receiving an input data value to be stored into one of the plurality of addressable storage cells;
• means for generating a write address that identifies one of the plurality of storage cells into which the input data value is to be written during a next write operation;
• and
• means for generating a read address that identifies one of the plurality of storage cells from which an output data value will be read during a next read operation;
• means for generating a test address signal;
• means for generating an input data parity value that is indicative of parity of the input data value;
• means for determining whether or not the test address signal equals the write address;
• parity storage means for storing the input data parity value during the next write operation when the test address signal equals the write address;
• means for generating an output data parity value that is indicative of parity of the output data value;
• means for determining whether or not the test address signal equals the read address;
• means for comparing the value stored in the parity storage means with the output data parity value during the next read operation when the test address signal equals the read address, and for asserting a hardware fault signal in response to a comparison indicating that the output data parity value is not equal to the value stored in the parity storage means.

In a system having addressable storage means comprising a plurality of addressable storage cells, data input means for receiving an input data value to be stored into one of the plurality of addressable storage cells specified by a write address during a write operation, and data output means for supplying an output data value from one of the plurality of addressable storage cells specified by a read address during a read operation, a method of testing the addressable storage means comprising the steps of:

• generating a test address;
• comparing the test address to the write address, and if the test address corresponds to the write address then storing the input data value into test storage means during the write operation, the test storage means thereafter supplying the stored input data value as a test data value at an output of the test storage means;
• comparing the test address to the read address;
• and
• if the test address corresponds to the read address then performing a test procedure comprising the steps of:
• comparing the test data value with the output data value;
• and
• if the test data value is not equal to the output data value, then asserting a hardware fault signal.

In a system having addressable storage means comprising a plurality of addressable storage cells, data input means for receiving an input data value to be stored into one of the plurality of addressable storage cells specified by a write address during a write operation, and data output means for supplying an output data value from one of the plurality of addressable storage cells specified by a read address during a read operation, a method of testing the addressable storage means comprising the steps of:

• generating a test address;
• comparing the test address to the write address, and if the test address corresponds to the write address then performing a first test procedure during the write operation, the first test procedure comprising the steps of:
• generating an input data parity value that is indicative of parity of the input data value;
• and
• storing the input data parity value into parity storage means, the test storage means thereafter supplying the stored input data parity value as a test parity value at an output of the test storage means;
• comparing the test address to the read address;
• and
• if the test address corresponds to the read address then performing a test procedure comprising the steps of:
• generating an output data parity value that is indicative of parity of the output data value;
• comparing the test parity value with the output data parity value;
• and
• if the test parity value is not equal to the output data parity value, then asserting a hardware fault signal.