Method and apparatus for forming bump structure used for flip-chip mounting, the bump structure and the flip-chip
AssigneeNEC Corporation
InventorsMasamoto Tago, Kei Tanaka
Life of this patent
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AssigneeNEC Corporation
InventorsMasamoto Tago, Kei Tanaka
Estimating the term…
A bump structure has a bump constituted by a metal projection which is formed on an electrode of a substrate, and a solder which covers the metal projection but does not touch the electrode. The metal projection is substantially spherical and has a projected portion at a center portion on an upper surface thereof. The metal projection is made of a metal having properties of solder diffusion prevention and adhesion to solder. The bump structure may have two bumps, the first bump being substantially the same as the bump described above and the second being such that its diameter is smaller than an outer diameter of the first bump and it covers the projected portion on the first bump. This bump structure can be formed using a simple process, and can be applied to flip-chip mounting in semiconductor devices with high reliability and yield.
A method of forming a bump comprising the steps of:
A method for forming a bump structure wherein a first bump is formed on a second bump, the first bump being made of a conductive material, a lower surface of which is fixed to an electrode of a substrate, and which is substantially spherical and has a projected portion at a center portion on an upper surface thereof, and the second bump being made of a conductive material, which covers said projected portion on said first bump and which has a diameter smaller than an outer diameter of said first bump, the method comprising the steps of:
A method for forming a bump structure wherein a first bump is formed on a second bump, the first bump being made of a conductive material, a lower surface of which is fixed to an electrode of a substrate, and which is substantially spherical and has a projected portion at a center portion on an upper surface thereof, and the second bump being made of a conductive material, which covers said projected portion on said first bump and which has a diameter smaller than an outer diameter of said first bump, the method comprising the steps of:
Dependencies are inferred from the claim text.