Frequency and amplitude measurement tool for electronic displays
AssigneeCadwell Industries, Inc.
InventorJohn A. Cadwell
Life of this patent
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AssigneeCadwell Industries, Inc.
InventorJohn A. Cadwell
Estimating the term…
A frequency and amplitude measurement tool for electronic displays is provided. The measurement tool automatically draws a measurement scale (24) on an electronic display screen (12) based upon operator inputs from an input device (18). The operator selects a first point (x.sub.0,y.sub.0) by depressing a key (19) on the input device (18), and selects a second point (x.sub.1,y.sub.1) by subsequent movement of the input device (18). The measurement tool draws a measurement scale (24) extending between the first and second points. The measurement scale (24) includes horizontal lines and vertical hash lines (54) that subdivide the horizontal distance between the first and second points so that the frequency calculated is an average frequency over the number of cycles represented by the subdivisions. The horizontal lines allow the operator to make amplitude measurements, and the vertical hash lines (54) allow the operator to align the measurement scale (24) with consecutive peaks or valleys of a waveform so that the average frequency of a portion of the waveform can be calculated.
A frequency measurement tool for measuring the average frequency of several cycles of a plurality of cycles of a variable-frequency, multiple-cycle waveform displayed on an electronic display, said frequency measurement tool including:
A method of providing operator-controlled frequency measurements of the average frequency of several cycles of a plurality of cycles of a variable-frequency, multiple-cycle waveform displayed on an electronic display, said method comprising:
The method claimed in claim 11, wherein said plurality of vertical hash lines are aligned horizontally and include first and second vertical hash lines respectively intersecting the first and second points of said two points, said plurality of vertical hash lines further including other vertical hash lines lying between said first and second vertical hash lines.
The method claimed in claim 12, wherein said method also includes allowing the operator to make amplitude measurements by;
Dependencies are inferred from the claim text.