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US 5,631,555 AGranted
Voltage measurement system
AssigneeHamamatsu Photonics K.K.
InventorsHironori Takahashi, Musubu Koishi, Akira Takeshima
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Abstract
An apparatus of this invention emits light onto an EO probe and detects the light reflected by the EO probe by using an MSM photodetector. The MSM photodetector is applied with a voltage of a frequency nf.sub.0 +.DELTA.f.
Claims12
A voltage measurement system comprising:
- (A) a probe adapted to be arranged near a device to be measured, said probe being comprised of an electro-optic material;
- (B) a photodetector for detecting light reflected by said probe;
- and
- (C) a unit for applying a voltage of a frequency nf.sub.0 +.DELTA.f to said photodetector, where,
- f.sub.0 is a frequency of a voltage signal to be applied to the device,
- n is an integer, and
- .DELTA.f is a predetermined frequency.
4 more elements
A voltage measurement system comprising:
- a probe adapted to be arranged near a device to be measured, said probe comprising an electro-optic material;
- a photodetector for detecting light reflected by said probe and providing an output signal responsive thereto;
- a mixer for receiving said output signal from said photodetector;
- and
- a unit for applying a voltage of a frequency nf.sub.0 +.DELTA.f to said mixer, wherein f.sub.0 is a frequency of a voltage signal to be applied to the device, n is an integer and .DELTA.f is a predetermined frequency, said mixer outputting a signal indicative of a voltage of said device to be measured.
2 more elements
Dependencies are inferred from the claim text.