Method and apparatus relating to test equipment with humidification capability
AssigneeVenturedyne, Ltd.
InventorsRobert A. Cutright, Richard Walker, Wayne Walton
Life of this patent
Estimating the term…
Loading patent…
AssigneeVenturedyne, Ltd.
InventorsRobert A. Cutright, Richard Walker, Wayne Walton
Estimating the term…
A new method provides test equipment having a humidification capability. Such method includes the steps of fabricating equipment having (a) a chamber for stress-testing products placed therein, and (b) a cavity for receiving a module. The equipment is installed in a product test facility and used for stress-testing (by, e.g., "temperature cycling") a first group of products placed in the chamber. Later (perhaps several months or years later), the module is mounted in the cavity, a second group of products is placed in the chamber and humidity-controlled air is circulated across the second group of products. The new method is particularly useful for manufacturers or testers of products like electronic printed circuit boards initially requiring only a temperature-related testing capability but later needing to add humidity-related testing regimens.
A method for testing electrical products and including the steps of:
In equipment for testing electronic products and having an enclosure containing a chamber for stress-testing circuit boards placed therein, the improvement comprising:
Dependencies are inferred from the claim text.