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US 5,630,947 AGranted
Method of making a multichip module comprising at least one thin film probe
OwnerShei-Kung Shi, Fu-Hsiang Tseng +1inventors
InventorsShei-Kung Shi, Fu-Hsiang Tseng, Chong-Kai Kuo
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Abstract
The present invention relates to the preparation of a multichip module comprising one or more thin film probes. The thin film probes are useful in in situ probe testing of IC chips. An assembly comprising the multichip module and a circuit board having IC chips in a number corresponding to the number of thin film probes is also claimed.
Claims9
A process for preparing a multichip module comprising one or more thin film probes, which process comprises the steps of:
- depositing a first metal layer evenly onto a transparent or non-transparent substrate;
- masking and etching said first metal layer according to a predetermined pattern;
- depositing an intermetal dielectric layer evenly thereover;
- etching said layer according to a second predetermined pattern;
- depositing a second metal layer evenly thereover;
- etching said layer according to a third predetermined pattern;
- depositing a second intermetal dielectric layer evenly thereover;
- etching said layer such that vias are formed according to a fourth predetermined pattern;
- evenly depositing a Cr film and then a Cu film thereover;
- evenly depositing a polyimide layer thereover;
- forming one or more recesses on the module by photomasking and developing to define a position for each thin film probe;
- filling each recess with soldering material;
- heating the multichip module to about 200.degree. C. to melt the soldering material;
- mechanically polishing the multichip module to flatten the polyimide and soldering material;
- removing the polyimide;
- depositing high hardness conducting material on the soldering material in each recess;
- forming one or more tip heads by etching the high hardness material in each recess;
- and
- depositing a nitride layer on the multichip module such that only each thin film probe is exposed.
16 more elements
Dependencies are inferred from the claim text.