Multiplexing electronic test probe

An analog electronic test probe comprising:

• a plurality of probe inputs divided into a plurality of probe input groups;
• an output;
• selection means for selecting one of said plurality of probe inputs;
• a plurality of multiplexers, each corresponding to one of said probe input groups;
• each of said multiplexers including a plurality of multiplexer inputs, each connected to a probe input in its corresponding probe input group;
• each of said multiplexers including a multiplexer output;
• each multiplexer responsive to said selection means for electrically connecting said selected probe input to its output when said selected probe input is in the group of probe inputs corresponding to said mutliplexer;
• and
• said multiplexer outputs being daisy-chained together and connectable to said probe output.

An analog electronic test probe comprising:

• a plurality of probe inputs divided into a plurality of probe input groups;
• an output;
• selection means for selecting one of said plurality of probe inputs;
• a plurality of integrated circuits, each corresponding to one of said probe input groups;
• each of said integrated circuits including a plurality of integrated circuit inputs, each connected to a probe input in its corresponding probe input group;
• each of said integrated circuits including an integrated circuit output;
• each integrated circuit responsive to said selection means for electrically connecting said selected probe input to its output when said selected probe input is in the group of probe inputs corresponding to said integrated circuit;
• and
• said integrated circuit outputs being daisy-chained together and connectable to said probe output.