Method for forming conductive line of semiconductor device
AssigneeSamsung Electronics Co., Ltd.
InventorsJi-hyun Choi, Hong-jae Shin, Byung-keun Hwang, U-in Chung
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AssigneeSamsung Electronics Co., Ltd.
InventorsJi-hyun Choi, Hong-jae Shin, Byung-keun Hwang, U-in Chung
Estimating the term…
A method for forming a conductive line uses a fluorine doped oxide layer as an insulating layer between conductive lines. The method comprises the steps of: (a) forming a fluorine doped oxide layer on a semiconductor substrate on which a lower structure is formed; (b) etching the oxide layer of the region where a conductive line is to be formed, thereby forming a trench; (c) forming an insulating layer on the overall surface of the resultant substrate; depositing conductive material on the resultant substrate; and (e) etching back the conductive material so that the conductive material is left on the trench only, thereby forming a conductive line. In this method, the conductive line is formed of aluminum-containing material and the insulating layer is formed of silicon dioxide. In the present invention, the insulating layer is interposed between the fluorine doped oxide layer and the aluminum-containing conductive line and thus the conductive line is free from corrosion.
A method for forming a conductive line of a semiconductor device, comprising the steps of:
A method for forming a conductive line of a semiconductor device, comprising the steps of:
A method for forming a conductive line of semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.