Method for forming a field-effect transistor including a mask body and source/drain contacts
AssigneeTexas Instruments Incorporated
InventorMark S. Rodder
Life of this patent
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Abstract
A thin film transistor and method for forming the same are disclosed. The transistor comprises a gate conductor (14) and a gate insulator (16). A semiconductor channel layer (18) is formed adjacent the gate insulator (16). A mask block (22) is formed covering a channel region (30) in the channel layer (18). A source region (26) and a drain region (28) are formed in the channel layer (18) adjacent opposite ends of the mask block (22). Conductive bodies (32) and (34) are formed in contact with source region (26) and drain region (28), respectively. Electric contacts (42) and (44) are then formed in contact with conductive bodies (32) and (34), respectively.
Claims35
A method for constructing a transistor, comprising the steps of:
- forming a gate conductor;
- forming a channel layer insulatively disposed adjacent the gate conductor and including a channel region;
- forming an insulative mask body over said channel layer so as to expose a first source/drain region and a second source/drain region, said insulative mask body being formed to a selected thickness;
- doping said first source/drain region and said second source/drain region within the channel layer, and said first and second source/drain regions spaced apart so as to define the channel region, the gate conductor being operable to electrically actuate the channel region;
- forming a first conductive body above and electrically coupled to the first source/drain region, said first conductive body having a thickness less than said selected thickness;
- forming an insulating layer above said first conductive body;
- and
- forming a first electric contact within an opening in said insulating layer and above and electrically coupled to the first conductive body.
A method for constructing a transistor, comprising the steps of:
- forming a gate conductor;
- forming a gate insulator outwardly from and adjacent the gate conductor;
- forming a channel layer outwardly from the gate insulator and insulated from the gate conductor by the gate insulator, the channel layer comprising a semiconductor material, a portion of said channel layer comprising a channel region;
- forming an insulative mask body of a selected thickness outwardly from said channel region;
- introducing impurities into first and second exposed regions of the channel layer adjacent opposite ends of the insulative mask body to form first and second source/drain regions spaced apart by said channel region;
- forming first and second conductive bodies adjacent and electrically coupled respectively to the first and second source/drain regions, said first and second conductive bodies being formed within the insulative mask body and having a thickness less than the selected thickness;
- forming an insulating layer overlying said first and second conductive bodies and said insulative mask body;
- forming a first contact hole within said insulating layer to expose at least a portion of said first conductive body and forming a second contact hole within said insulating layer to expose at least a portion of said second conductive body;
- and
- forming first and second electric contacts within the first and second contact holes and adjacent and electrically coupled respectively to the first and second conductive bodies.
A method for constructing a transistor, comprising the steps of:
- forming a gate conductor;
- forming a gate insulating layer over said gate conductor;
- depositing a layer of semiconductor material on said gate insulator layer to form a channel wherein said channel layer comprises a partially recrystallized semiconductor material;
- forming a first source/drain region and a second source/drain region within the channel layer and spaced apart so as to define the channel region between the first source/drain region and the second source/drain region, the gate conductor being operable to electrically actuate the channel region;
- forming a first conductive body above and electrically coupled to the first source/drain region;
- and.
A method of forming a transistor comprising the steps of:
- forming a gate conductor;
- forming a channel layer insulatively disposed above the gate conductor and including a channel region;
- forming a mask body over said channel layer, said mask body formed so as to expose a first region and a second region within said channel layer, wherein said first region and said second region are separated by said channel region;
- doping said first region to form a first source/drain region and doping said second region to form a second source/drain region, said first and second source/drain regions self-aligned to said mask body;
- conformally depositing a conductive layer and then, without patterning, etching the conductive layer to form a first conductive body over said first source/drain region and abutting said mask body and to form a second conductive body over said second source/drain region and abutting said mask body;
- and
- forming a first electrically conductive region adjacent and electrically coupled to the first conductive body.
Dependencies are inferred from the claim text.