Method for locating flaws in a smooth surface of an object
AssigneeFord Motor Company
InventorsPaul J. Stewart, Yifan Chen
Life of this patent
Estimating the term…
Abstract
A method for locating flaws in a smooth surface using at least one light source includes the steps of setting the light source at a predetermined length above the smooth surface, locating a highlight line, translating the light source across the smooth surface to create a plurality of highlight lines and locating distortions in the smooth surface.
Claims7
A method for locating flaws in a smooth surface using at least one light source, the method comprising the steps of:
- setting the light source a predetermined length above the smooth surface;
- locating a highlight line;
- translating the light source across the smooth surface to create a plurality of highlight lines;
- decomposing each of the highlight lines into their respective spatial components;
- measuring spatial parameters of each of the highlight lines;
- transforming the spatial parameters into frequency parameters;
- comparing the frequency parameters to a threshold;
- identifying frequency parameters exceeding the threshold signal;
- and
- locating flaws in the smooth surface.
A method for locating flaws into a smooth surface using a plurality of light sources, the method comprising the steps of:
- setting the light sources at a predetermined length above the smooth surface;
- locating highlight lines, each of the highlight lines created by each of the light sources;
- decomposing each of the highlight lines into their respective spatial components;
- measuring spatial parameters of each of the highlight lines;
- transforming the spatial parameters into frequency parameters;
- comparing the frequency parameters to a threshold;
- identifying frequency parameters exceeding the threshold signal;
- and
- locating flaws in the smooth surface.
A method for fabricating an object having a smooth surface using at least one light source, the method comprising the steps of:
- defining a preliminary piece source a predetermined length above the smooth surface;
- locating a highlight line;
- translating the light source across the smooth surface to create a plurality of highlight lines;
- locating flaws in the smooth surface;
- illuminating the flaws from the smooth surface of the preliminary piece;
- shaping a tool to produce the piece from the preliminary piece after eliminating the flaws therefrom;
- setting the light source a predetermined length above the tool;
- locating a highlight line;
- translating the light source across the tool to create a plurality of highlight lines;
- decomposing each of the highlight lines into their respective spatial components;
- measuring spatial parameters of each of the highlight lines;
- transforming the spatial parameters into frequency parameters;
- comparing the frequency parameters to a threshold;
- identifying frequency parameters exceeding the threshold signal;
- and
- locating flaws in the tool.
Dependencies are inferred from the claim text.