Arrangement for high-resolution scanning of large image formats with exact geometrical correspondence
AssigneeRheinmetall Jenoptik Optical Metrology GmbH
InventorsRalf Goldschmidt, Werner Borchardt
Life of this patent
Estimating the term…
Loading patent…
AssigneeRheinmetall Jenoptik Optical Metrology GmbH
InventorsRalf Goldschmidt, Werner Borchardt
Estimating the term…
An arrangement for high-resolution scanning of large image formats with exact geometrical correspondence is described. It is applied in photogrammetry and in optoelectronic scanners with high requirements regarding exact geometrical correspondence. Metric image contractions of large image formats are obtained without dimension-embodying auxiliary means by employing a CCD matrix which is exactly dimensioned to pixel sensitivity distribution. This CCD matrix is used as an absolute dimensional embodiment, from which only one active pixel area determined as a function of the memory area of the frame grabber is adopted into the frame grabber while ensuring an image contraction which is absolutely synchronous with the pixels. Based on the pixel raster, this active pixel area forms the step width for the high-precision scanning mechanism which is adapted with respect to its accuracy, wherein the active pixel areas of the scanning steps are lined up so as to cover the surface without gaps and substantially without overlaps. Dimension-embodying auxiliary means, e.g. network grids, can accordingly be dispensed with without any impairment of accuracy.
In an arrangement for high-resolution scanning of large image formats for providing scanned images of said large-image formats with substantially exact geometrical correspondence, said arrangement having at least one CCD matrix whose magnitude constitutes only a fraction of the image model to be scanned, a frame grabber, and a movement mechanism, the improvement comprising:
Dependencies are inferred from the claim text.