Method and system for generating product performance history

A database system, comprising:

• a plurality of database servers, each containing at least a portion of data comprising a database, said data being in a predetermined format;
• a communications network coupled to each of said plurality of database servers;
• at least one client server coupled to said communications network, for inputting database search requests;
• wherein at least one of said plurality of database servers receives said database search request, searches for data in one or more of said plurality of database servers and produces data responsive to said database search request;
• at least one input system, coupled to said communications network, for inputting data in at least a first format;
• a reformatter, coupled to said communications network, for receiving said data and reformatting said data into a predetermined format to produce reformatted data;
• and
• at least one loader, coupled to said at least one of said plurality of database servers, for loading said reformatted data into said at least one of said plurality of database servers.

A method of manufacturing a semiconductor device, comprising the steps of:

• processing a semiconductor material in a series of steps to form a semiconductor circuit;
• collecting process data of a prescribed format from one or more of said processing steps;
• testing said semiconductor circuit in at least one test step;
• collecting test data of the prescribed format from said at least one test step;
• reformatting said process data and said test data into a predetermined data format to produce reformatted data;
• and
• loading said reformatted data into at least one database server to produce a database containing said process data and said test data in a predetermined format.