Learning method and apparatus for detecting and controlling solder defects
AssigneeHewlett-Packard Company
InventorsPaul A. Roder, John A. Adams, Bruce D. Baker, Robert L. Corey, Edward W. Ross
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AssigneeHewlett-Packard Company
InventorsPaul A. Roder, John A. Adams, Bruce D. Baker, Robert L. Corey, Edward W. Ross
Estimating the term…
A method and apparatus which incorporate self learning techniques for the detection of solder defects and for statistical process control of solding operations on printed circuit board assemblies (PCBA) are disclosed. The invention includes learning techniques which are used during the inspection of cross-sectional X-ray images of solder joints. These learning techniques improve measurement accuracy by accounting for localized shading effects, which can occur when inspecting double-sided printed circuit board assemblies. Two specific examples are discussed. The first is a method for detection of solder short defects. The second method utilizes learning to improve the accuracy of statistical process control (SPC) measurements.
A method of determining the quality of an electrical connection comprising the steps of:
An apparatus for determining the quality of an electrical connection comprising:
A method of detecting solder bridging defects on a circuit board comprising the steps of:
An apparatus for monitoring a solder application device which forms solder joints, said apparatus comprising:
A method for inspecting a printed circuit board, said method comprising the steps of:
Dependencies are inferred from the claim text.