Micromechanical accelerometer with plate-like semiconductor wafers
AssigneeLITEF GmbH
InventorsThomas Gessner, Martin Hafen, Eberhard Handrich, Peter Leinfelder, Bruno Ryrko, Egbert Vetter, Maik Wiemer
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AssigneeLITEF GmbH
InventorsThomas Gessner, Martin Hafen, Eberhard Handrich, Peter Leinfelder, Bruno Ryrko, Egbert Vetter, Maik Wiemer
Estimating the term…
A high precision micromechanical accelerometer comprises a layered structure of five (5) semiconductor wafers insulated from one another by thin oxide layers. The accelerometer is formed by first connecting a coverplate and a baseplate to associated insulating plates. Counter-electrodes, produced by anisotropic etching from the respective insulating plates, are fixed to the coverplate and the baseplate respectively. The counter-electrodes are contactable through the cover or baseplate via contact windows. A central wafer contains a unilaterally linked mass (pendulum) that is also produced by anisotropic etching and which serves as a movable central electrode of a differential capacitor. The layered structure is hermetically sealed by semiconductor fusion bonding. A stepped gradation from the top is formed at a wafer edge region for attaching contact pads to individual wafers to permit electrical contacting of individual wafers. The invention permits fabrication of a .mu.B device characterized by extremely small leakage capacitances and high temperature stability.
A micromechanical accelerometer in which a movably suspended mass forms the central electrode of a differential capacitor comprising, in combination:
A micromechanical accelerometer produced by the process of:
Dependencies are inferred from the claim text.