Loading patent…
AssigneeInternational Business Machines Corporation
InventorsDonald H. Canfield, Todd C. Fellows, Earle W. Gillis, Peter J. Yablonsky
Estimating the term…
A dual mode illumination system for optical inspection of products for surface defects and defects in holes in the product includes a first light source for providing illumination along an axis of one or more holes in the product to be inspected, the first light source being positioned on a first side of the product, a second light source providing illumination of the surface of the second side of the product to be inspected, a beam splitter for redirecting light from the second light source to a light sensor while passing light from the first light source to the light sensor. The second light source may be located adjacent to a second side of the product to be tested with the axis of illumination parallel to a major plane of the product. The light sensor may be a video camera connected to a data processing and display system.
An optical inspection system, comprising:
A method for optical inspection of a product having one or more apertures therein, comprising the steps of:
An optical inspection system, comprising:
Dependencies are inferred from the claim text.