Process for the production of semiconductor devices
AssigneeFujitsu Limited
InventorsMichiko Kobayashi, Syun-ichi Fukuyama, Yoshihiro Nakata, Masanori Naitou, Hiroshi Kudo, Yoshiyuki Ohkura
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AssigneeFujitsu Limited
InventorsMichiko Kobayashi, Syun-ichi Fukuyama, Yoshihiro Nakata, Masanori Naitou, Hiroshi Kudo, Yoshiyuki Ohkura
Estimating the term…
Process for the production of semiconductor devices comprising the steps of applying a solution of the specified polycarbosilane in a solvent onto a substrate having electrically conductive components fabricated therein, and curing the coated layer of the polycarbosilane at a temperature of not less than 350.degree. C. in an oxidizing atmosphere to thereby covert the polycarbosilane layer to a silicon oxide layer. The resulting silicon oxide layer has a planarized surface and has no cracking and accordingly is useful as a dielectric layer and a protective layer in the production of semiconductor devices having a high reliability.
A process for the production of a semiconductor device which comprises the steps of applying a solution of polycarbosilane of the general formula (1):
Dependencies are inferred from the claim text.